Hw Semiconductor Engineering

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Hw ijA fqvEA\]A pvHwB Semiconductor Engineering (semiconductor engineering), design and manufacture of semiconductor devices, performance evaluation and life of engineering handling and measurement using semiconductors. LlZpWB Various technology-related as follows.

[ W ] v Design

Hv Circuit Design
- CAD A EDA CAD, EDA
vZXEfoCX\viV~[Vj Device structure design process (simulation)
- TCAD ( vZXV~[V A foCXV~[V ) TCAD (simulation process, simulation devices)
p@v Design of manufacturing equipment

[ W ] Zp Manufacturing Technology

`NXL[@ Law CHOKURARUSUKI
][g@ Law ZONMERUTO
gU iMgUjE_ iM_j Diffusion (thermal diffusion) oxidation (thermal oxidation)
Deposition
Xpb^O Sputtering
XsR[g Spin coat
CVD iwC@j CVD (chemical vapor)
PVD iC@j PVD (physical vapor deposition)
MBE iqGs^LV[@j MBE (molecular beam epitaxy)
Gs^LV Epitaxial growth
CI Ion implantation
tHg\OtB ip^[jOj FOTORISOGURAFI (patterning)
Gb`O Etching
FIB (Focused Ion Beam) FIB (Focused Ion Beam)
CMP iw@Bj CMP (chemical mechanical polishing)
^CY izj METARAIZU (Wiring)
- wz Multi-layer
o Detect manufacturing defects
- eXgp^[ Test pattern
- H Process control
_CVO Dicing
pbP[WO igj Packaging (assembly)

[ W ] Ei Measurement methods for characteristics of the semiconductor properties

lXAJ]pApr[WB Shows a semiconductor-like properties and is also used to characterize the manufacturing and research and development, many are also deeply involved in semiconductor applications.

dC`x Conductivity
z[ Hall effect
PN VbgL[F Characteristics of PN junction SHOTTOKI and bonding:
- d - dA RweA [[xbNEyeBG A Nd A GNg~lZX Current - characteristics of voltage, capacitance layer poor sky, the effect Peltier Seebeck effect, photovoltaic effect, electroluminescence
gsF EDX A EPMA A SIMS A ICP Impurities and composition: EDX, EPMA, SIMS, ICP
\F w A XRD A RBS A } A SEM A TEM A AFM A XRF A SPM A SCM Structure: microscopic optical, XRD, RBS, effective Raman, SEM, TEM, AFM, XRF, SPM, SCM
oh\F dEdq A tdq A DLTS A tHg~lZX Structure and band: Spectroscopic photoelectric effect electric light, inverse photoemission spectroscopy, DLTS, photoluminescence

[ W ] i\] Performance of Products

dCI Electrical Characteristics
- DC DC characteristics
- AC AC characteristics
Life
M Reliability

[ W ] A See also

GNgjNXp List of electronics terms

\ E b E E History Hen talk table i JeS j Semiconductor (category)

Classification	P^ - N^ - ^ - s Semiconductor P-type - N semiconductor type - Semiconductor true - Semiconductor impurities

Type	- _ - At@X - Semiconductor nitride - semiconductor and oxide - semiconductor amorphous - semiconductor magnetic

fq Semiconductor device	WH - }CNvZbT - - TTL_fq Integrated Circuits - microprocessor - memory chip - TTL logic elements

oh_ Band theory	oh\ - ohvZ - ohvZ - ` - dq - - tF~ - s - dq - E - hi[ - ANZv^ - w Parent bands - calculated band - calculate first-principles band - band conduction - valence band - Band contraband - level LumiQuest Fellows - ranked quasi impurities - electron - hole - donor - acceptor - physics properties

gWX^ Transistors	TCX^ - oC\|[gWX^ (PNP, NPN) - dEgWX^ Thyristors - bipolar transistor (PNP, NPN) - transistor field-effect

A Related	_CI[h - zdr Diodes - solar cells

Other	pn - Rw - VbgL[ - MOS - dqHw - dqH - Hw - - pn junction - layer depletion - junction - junction MOS - Engineering Electronics - Circuits Electronics - Engineering semiconductor - metal - body insulation

[ W ] ON External links

u Hw vA HwEZpAB This "Semiconductor Technology", items on which to write the technology, engineering. MA B Touch, we asked participants toSARU and correct.

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